Helium Ion Microscopy

Author: Gregor Hlawacek
Publisher: Springer
ISBN: 3319419900
Size: 49.53 MB
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This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging.

Helium Ion Microscopy

Author: David C. Joy
Publisher: Springer Science & Business Media
ISBN: 1461486602
Size: 42.37 MB
Format: PDF, Mobi
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Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the ...

The Nanoscience And Technology Of Renewable Biomaterials

Author: Lucian A. Lucia
Publisher: John Wiley & Sons
ISBN: 9781444307481
Size: 43.51 MB
Format: PDF, ePub
View: 630
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Resolution is typically a few microns, and sensitivity is far better for heavy atoms
than for oxygen and carbon (137). Gases in the specimen chamber also scatter
electrons, so variable pressure or 'environmental' EDX analyses almost always
has more background than measurements at high vacuum. Helium Ion
Microscopy A helium ion microscope is analogous to an SEM except that helium
ions, rather than electrons, bombard the specimen. Helium ion microscopes
provides a ...

Surface Science Techniques

Author: Gianangelo Bracco
Publisher: Springer Science & Business Media
ISBN: 3642342434
Size: 57.83 MB
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78. 79. 80. S. Ogawa, T. Iijima, S. Awata, S. Kakinuma, S. Komatani, T. Kanayama
, Helium ion microscope characterization for Cu/low-k interconnects—SE imaging
and focused helium ion beam luminescence detection, in Proceedings of the
Interconnect Technology Conference and 2011 Materials ... A.A. Bettiol, Proton
beam writing: a new 3D nanolithographic technique, in Ion Beams in
Nanoscience and Technology, Particle Acceleration and Detection, ed. by R.
Hellborg et al., pp.

Nanotubes And Nanosheets

Author: Ying (Ian) Chen
Publisher: CRC Press
ISBN: 1466598107
Size: 60.11 MB
Format: PDF, ePub, Docs
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Petrov, Y. V., O. F. Vyvenko, and A. S. Bondarenko. Scanning helium ion
microscope: Distribution of secondary electrons and ion channeling. Journal of
Surface Investigation-X-Ray Synchrotron and Neutron Techniques 4, (2010): 792
–795. Pickard, D., B. Oezyilmaz, J. Thong, K. P. Loh, V. Viswanathan, A. hongkai,
S. Mathew et al. Graphene nanoribbons fabricated by helium ion microscope.
APS March Meeting 2010 (2010): http://adsabs.harvard.edu/ abs/2010APS.

Nanoscience And Nanoengineering

Author: Ajit D. Kelkar
Publisher: CRC Press
ISBN: 1482231204
Size: 77.37 MB
Format: PDF, ePub
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Scipioni, L., Alkemade, P., Sidorkin, V., Chen, P., Maas, D., and van Veldhoven, E
. The helium ion microscope: Advances in technology and applications. American
Laboratory 41, 26–28, 2009. Bell, D.C., Lemme, M.C., Stern, L.A., Rwilliams, J.,
and Marcus, C.M. Precision cutting and patterning of graphene with helium ions.
Nanotechnology 20, 455301, 2009. Lemme, M.C., Bell, D.C., Williams, J.R., Stern
, L.A., Baugher, B.W.H., Jarillo-Herrero, P., and Marcus, C.M. Etching of graphene

Advances In Imaging And Electron Physics

Publisher: Academic Press
ISBN: 0123978432
Size: 30.39 MB
Format: PDF, Mobi
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Scanning helium ion microscope: Distribution of secondary electrons and ion
channeling. Journal of Surface Investigation. X-ray, Synchrotron and Neutron
Techniques, 4(5), 792–795. Rabalais, J. W. (2003). Principles and Applications of
Ion Scattering Spectroscopy. John Wiley & Sons, Hoboken, NJ. Rahman, F.,
Onoda, J., Imaizumi, K., & Mizuno, S. (2008). Field-assisted oxygen etching for
sharp field-emission tip. Surface Science, 602(12), 2128–2134. Ramachandra, R
., Griffin, B., ...


Author: Maria Stepanova
Publisher: Springer Science & Business Media
ISBN: 9783709104248
Size: 66.62 MB
Format: PDF, Kindle
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State-of-the-art performance of the technique is illustrated with experimental
achievements in HSQ and PMMA resists. Exploratory SHIBL work on aluminum
oxide resist is presented as a novel approach to overcome potential shot noise
effects in pattern definition and to improve masking capabilities in subsequent
pattern transfer. 4.1 Introduction The launch of the helium ion (He+) microscope
by Zeiss/Alis [1] has opened novel perspectives in nanotechnology, both from an
imaging ...

Stm Characterization Of Phenylene Ethynylene Oligomers On Au 111 And Their Integration Into Carbon Nanotube Nanogaps

Author: Thiele, Cornelius
Publisher: KIT Scientific Publishing
ISBN: 3731502356
Size: 59.18 MB
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Helium ion microscopy of graphene: beam damage, image quality and edge
contrast”. Nanotechnology 24 (2013), 335702. doi: 10.1088/0957-4484/24/33/
335702. M. M. Marshall, J. Yang, and A. R. Hall. “Direct and transmission milling
of suspended silicon nitride membranes with a focused helium ion beam”. Scan-
ning 34 (2012), 101–106. doi: 10.1002/sca.21003. O. Scholder, K. Jefimovs, I.
Shorubalko, C. Hafner, U. Sennhauser, and G.-L. Bona. “Helium focused ion
beam ...

Swift Ion Beam Analysis In Nanosciences

Author: Denis Jalabert
Publisher: John Wiley & Sons
ISBN: 1119008670
Size: 66.86 MB
Format: PDF, ePub
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44, 2015. [VEL 12] VELIGURAV., HLAWACEK G., VAN GASTEL R. et al., “
Channeling in helium ion microscopy: Mapping of crystal orientation”, Beilstein
Journal of Nanotechnology, vol. 3, p. 501, 2012. [VEL 15] VELIGURAV.,
HLAWACEK G., GASTEL R. et al., “Investigation of ionoluminescence of
semiconductor materials using helium ion microscopy”, Journal of Luminescence
, vol. 157, p. 321, 2015. [VIC 90]VICKRIDGE I., AMSEL G., “SPACES: A PC
implementation of the stochastic ...