Transmission Electron Microscopy

Author: C. Barry Carter
Publisher: Springer
ISBN: 3319266519
Size: 40.75 MB
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This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter.

Transmission Electron Microscopy

Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 1475725191
Size: 51.34 MB
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Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in ...

Scanning Transmission Electron Microscopy

Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 9781441972002
Size: 36.99 MB
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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity.

Publisher: 清华大学出版社有限公司
ISBN: 9787302082132
Size: 18.56 MB
Format: PDF, Kindle
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The contents of the book can be grouped into three parts. The first part (Chapters
1-6) is about the diffraction, imaging, and spectroscopy of carbon-based
nanotubes. The second part (Chapters 7-9) describes the physical property
nanomeasurements of carbon nanotubes based on in-situ TEM. The last part (
Chapters 10-12) is about inorganic tubular structures and one-dimensional
nanocrystals grown by filling nanotubes. The text is organized in a coherent and
logical manner so that ...

Principles Of Electron Optics Volume 1

Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 0081022573
Size: 35.76 MB
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H. Busch (1927). U ̈ber die Wirkungsweise der Konzentrierungsspule bei der
Braunschen Ro ̈hre. Arch. Elektrotech. 18, 583À594. H. Busch and E. Bru ̈che,
Eds (1937). Beitra ̈ge zur Elektronenoptik (Barth, Leipzig). D. C. Carey (1987).
The Optics of Charged Particle Beams (Harwood, Chur, London & New York).
C. B. Carter and D. B. Williams, Eds (2016). Transmission Electron Microscopy.
Diffraction, Imaging, and Spectrometry (Springer, Switzerland). R. Castaing (1951
) ...

Transmission Electron Microscopy

Author: Ludwig Reimer
Publisher: Springer
ISBN: 3662148242
Size: 43.75 MB
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This fourth edition includes discussion of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.

Principles Of Electron Optics Volume 2

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128134054
Size: 32.44 MB
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... currentÀvoltage characteristics with classical field emission theory. J. Vac. Sci.
Technol. B 34,041802, 7 pp. T. Komoda (1960). Performances of the gun with a
re-entrant shaped Wehnelt cylinder. J. Electronmicrosc 8, 8À12. P. Kruit (2007).
The role of MEMS in maskless lithography. Microelectron. Eng. 84, 1027À1032. P
. Kruit (2016). Electron sources. In Transmission Electron Microscopy, Diffraction,
Imaging and Spectroscopy (C. B. Carter and D. B. Williams, Eds), 1À15 (Springer,

Advances In Optical And Electron Microscopy

Author: T Mulvey
Publisher: Academic Press
ISBN: 1483282244
Size: 33.74 MB
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This book discusses the instrumentation and operation for high-resolution electron microscopy; diffraction pattern and camera length; and electron microscopy of surface structure.

Chemical Imaging Analysis

Author: Freddy Adams
Publisher: Elsevier
ISBN: 0444634509
Size: 49.43 MB
Format: PDF, Docs
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Diffraction topography, 239–240 Diffuse Reflectance Infrared FT Spectroscopy (
DRIFTS), 99 Digital camera system, 283 Digital image reconstruction, 34–35 2,5-
dihydroxybenzoic acid, 193 Dimensionality reduction, 22 Direct Analysis in Real
Time (DART), 80, 161, ... See Dynamic Light Scattering Doped polycrystalline Si
films, 146 Double-focussing mass spectrometer, 169 DRIFTS. ... See Energy-
Filtered Transmission Electron Microscopy Effective Attenuation Length (EAL), 44