Transmission Electron Microscopy

Author: C. Barry Carter
Publisher: Springer
ISBN: 3319266519
Size: 55.32 MB
Format: PDF
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This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter.

Transmission Electron Microscopy

Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 0387765018
Size: 79.97 MB
Format: PDF, Kindle
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This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.

Transmission Electron Microscopy

Author: David Bernard Williams
Publisher: Springer Science & Business Media
ISBN: 9780306452475
Size: 49.87 MB
Format: PDF
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This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Scanning Transmission Electron Microscopy

Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 9781441972002
Size: 39.40 MB
Format: PDF, ePub
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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity.

Transmission Electron Microscopy

Author: Ludwig Reimer
Publisher: Springer
ISBN: 3662148242
Size: 62.99 MB
Format: PDF
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This fourth edition includes discussion of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.

Principles Of Electron Optics

Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 0081022573
Size: 67.30 MB
Format: PDF, Mobi
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H. Busch (1927). U ̈ber die Wirkungsweise der Konzentrierungsspule bei der
Braunschen Ro ̈hre. Arch. Elektrotech. 18, 583À594. H. Busch and E. Bru ̈che,
Eds (1937). Beitra ̈ge zur Elektronenoptik (Barth, Leipzig). D. C. Carey (1987).
The Optics of Charged Particle Beams (Harwood, Chur, London & New York).
C. B. Carter and D. B. Williams, Eds (2016). Transmission Electron Microscopy.
Diffraction, Imaging, and Spectrometry (Springer, Switzerland). R. Castaing (1951
) ...

Aberration Corrected Analytical Transmission Electron Microscopy

Author: Rik Brydson
Publisher: John Wiley & Sons
ISBN: 1119979900
Size: 51.91 MB
Format: PDF, ePub
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This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry ...

Advances In Optical And Electron Microscopy

Author: T Mulvey
Publisher: Academic Press
ISBN: 1483282244
Size: 28.87 MB
Format: PDF, Docs
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This book discusses the instrumentation and operation for high-resolution electron microscopy; diffraction pattern and camera length; and electron microscopy of surface structure.